IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast ADC Testing by Repetitive Histogram Analysis

IEEE Instrumentation and Measurement Technology Conference

Author(s): A.C. Serra ; F. Alegria ; L. Michaeli ; P. Michalko ; J. Saliga
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,633 - 1,638
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328161
Regular:

Modeling the integral nonlinearity by the unified behavioral error model which is expressed as one dimensional image in the code k domain requires a minimal number of error parameters. The unified... View More

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