IEEE - Institute of Electrical and Electronics Engineers, Inc. - Data Uncertainty Sensitivity Analysis for Reduced Complexity SVM Classifiers

IEEE Instrumentation and Measurement Technology Conference

Author(s): M. Gubian ; A. Boni ; D. Petri
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,500 - 1,505
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328647
Regular:

In this paper we investigate experimentally how different sources of uncertainty affect the classification performance of an SVM based binary classifier. Our aim is to find statistically sound... View More

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