IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Interaction Between Metrological Parameters and Industrial Process Simulation Requirements for Equipment Scale-Up/Down by means of Dimensional Analysis

IEEE Instrumentation and Measurement Technology Conference

Author(s): F.A. Batzias
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,490 - 1,495
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328645
Regular:

Industrial process scale up from laboratory to large scale by means of similarity theory and relevant techniques implies usually deviation of metrological parameter values, as a result of... View More

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