IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Accuracy of Generalized Hammerstein Models for Nonlinear Active Noise Control

IEEE Instrumentation and Measurement Technology Conference

Author(s): G.L. Sicuranza ; A. Carini
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,411 - 1,416
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328598
Regular:

In this paper we extend a filtered-X affine projection (AP) algorithm for active noise control to controllers exploiting the recently proposed functional link artificial neural network (FLANN)... View More

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