IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Simulation Framework for Rapid Development of Microprocessor Based Measurement Systems

IEEE Instrumentation and Measurement Technology Conference

Author(s): S. Corbellini ; F. Ferraris ; M. Parvis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,348 - 1,352
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328559
Regular:

This paper describes a framework which can be used to simplify the development of microprocessor based instruments. The framework is based on digital simulators which describe the behavior of the... View More

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