IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Automated Instrumentation for Performance Evaluation of MOSFET Radiation Sensors

IEEE Instrumentation and Measurement Technology Conference

Author(s): P. Tsardaklis ; Th. Xaopoulos ; S. Siskos ; G. Sarrabayrouse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,326 - 1,329
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328523
Regular:

An automated instrumentation configuration based on a small microcontroller is presented in this work. This experimental setup is designed for data collection from multiple measurement approaches... View More

Advertisement