IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Versatile and Compact USB System for Electrical and Thermal Characterization of Non-Volatile Memories

IEEE Instrumentation and Measurement Technology Conference

Author(s): D. Baderna ; A. Cabrini ; L. Gobbi ; G. Torelli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,217 - 1,220
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328481
Regular:

This paper presents a multipurpose, versatile and portable test equipment suitable for non-volatile memories performance evaluation. The system is based on a reconfigurable testing board which can... View More

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