IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compensation of Temperature-Drift Errors in Fundamental-Mode Orthogonal Fluxgates

IEEE Instrumentation and Measurement Technology Conference

Author(s): A. Plotkin ; E. Paperno ; A. Samohin ; I. Sasada
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,201 - 1,204
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328450
Regular:

A new method for the temperature-compensation of fundamental-mode orthogonal fluxgates that does not require additional hardware has been proposed and implemented. The method is based on... View More

Advertisement