IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded Narrow Pulse Measurement in Digital CMOS

IEEE Instrumentation and Measurement Technology Conference

Author(s): M. Safi-Harb ; G.W. Roberts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,195 - 1,200
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328449
Regular:

This paper examines an embedded low-power technique for the single-shot measurement of narrow pulse signals. The circuit serves as an embedded diagnosis tool for the characterization of compressed... View More

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