IEEE - Institute of Electrical and Electronics Engineers, Inc. - Far-Field Microcontroller Based Automated Microwave Measurement System for Characterization of Dielectric Permittivity of High-Loss Materials

IEEE Instrumentation and Measurement Technology Conference

Author(s): U. Cem Hasar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 942 - 947
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328261
Regular:

A microcontroller based microwave free-space measurement system for a real-time determination of dielectric permittivity of high loss planar materials is proposed. The measurement system is... View More

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