IEEE - Institute of Electrical and Electronics Engineers, Inc. - Digitally Self-Calibrated Pipelined Analog-to-Digital Converter
IEEE Instrumentation and Measurement Technology Conference
Author(s): | O. Bernal ; F. Bony ; P. Laquerre ; M. Lescure |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 April 2006 |
Conference Location: | Sorrento, Italy |
Conference Date: | 24 April 2006 |
Page(s): | 900 - 904 |
ISBN (CD): | 0-7803-9360-0 |
ISBN (Paper): | 0-7803-9359-7 |
ISSN (Paper): | 1091-5281 |
DOI: | 10.1109/IMTC.2006.328243 |
Regular:
This paper presents a digital capacitor error-averaging calibration technique for pipelined analog-to-digital converters (ADCs). The scheme utilizes a 1.5b/stage digital calibration algorithm and... View More