IEEE - Institute of Electrical and Electronics Engineers, Inc. - Digitally Self-Calibrated Pipelined Analog-to-Digital Converter

IEEE Instrumentation and Measurement Technology Conference

Author(s): O. Bernal ; F. Bony ; P. Laquerre ; M. Lescure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 900 - 904
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328243
Regular:

This paper presents a digital capacitor error-averaging calibration technique for pipelined analog-to-digital converters (ADCs). The scheme utilizes a 1.5b/stage digital calibration algorithm and... View More

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