IEEE - Institute of Electrical and Electronics Engineers, Inc. - Prototype of Device Based on Hybrid Junctions for Measuring Electromagnetic Conducted Emissions

IEEE Instrumentation and Measurement Technology Conference

Author(s): A. De Bonitatibus ; C. De Capua ; A. Liccardo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 536 - 541
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328585
Regular:

The paper concerns with the realization of a device for measurement of EM conducted interferences, in alternative to set-up suggested by CISPR standard rules. This technique allows, in particular,... View More

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