IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise Consideration for Micromachined Digital Accelerometers

IEEE Instrumentation and Measurement Technology Conference

Author(s): M. Kollar ; L. Michaeli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 507 - 512
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328552
Regular:

Three noise sources are present in a sigma-delta modulator (SigmaDeltaM) type system applied to a micromachined accelerometer: mechanical noise due to Brownian motion, electronic noise introduced... View More

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