IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extraction of Dispersive Material Parameters Using Vector Network Analyzers and Genetic Algorithms

IEEE Instrumentation and Measurement Technology Conference

Author(s): Jianmin Zhang ; M.Y. Koledintseva ; D.P. Pommerenke ; J.L. Drewniak ; K.N. Rozanov ; G. Antonini ; A. Orlandi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 462 - 467
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328518
Regular:

A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and... View More

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