IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interactive BIST for Embedded Core in SOC: Partial Matching and Control Sequences Technique

IEEE Instrumentation and Measurement Technology Conference

Author(s): T. Reungpeerakul ; D. Kay ; S. Mourad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 365 - 369
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328473
Regular:

With core based design having been widely adopted, the use of BIST techniques has become more attractive testing approach. There are several techniques deployed to make BIST more efficient. Among... View More

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