IEEE - Institute of Electrical and Electronics Engineers, Inc. - Figures of Merit for Analog-to-Digital Converters: Analytic Comparison of International Standards

IEEE Instrumentation and Measurement Technology Conference

Author(s): S. Rapuano
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 134 - 139
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328330
Regular:

In the paper the analytic comparison of dynamic parameters used for qualifying ADCs in the frequency domain reported in the most diffused standards is provided. This could be the first step... View More

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