IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Approach to Sparse Model Selection and Averaging

IEEE Instrumentation and Measurement Technology Conference

Author(s): Y. Selen ; E. Gudmundson ; P. Stoica
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 113 - 116
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328295
Regular:

Parameter estimation when the true model structure is unknown is a commonly occurring task in measurement problems. In a sparse modeling scenario, the number of possible models grows exponentially... View More

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