IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Emulation Technique for Diagnosis and Failure Analysis of ATE

IEEE Instrumentation and Measurement Technology Conference

Author(s): H. Hashempour ; F. Lombardi ; Rakesh Mehta ; T. Alton ; W. Necoechea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 96 - 100
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328291
Regular:

This paper deals with a novel emulation technique which is applicable to the diagnosis and failure analysis of automatic-test-equipment (ATE) as widely used for testing integrated circuits... View More

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