IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thickness Measurements of Plastic Sheets during the Manufacturing Process: Comparison of Errors with Soft X-ray Thickness and the New Laser Measuring Systems

IEEE Instrumentation and Measurement Technology Conference

Author(s): F. Tojo ; S. Hirakawa ; T. Toyoda ; M. Itoh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 12 - 15
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328354
Regular:

With the development of advanced technology, there has been an increased demand for polymer sheets for use in various applications, along with the requirement to measure the thickness of such... View More

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