IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research of Multi-operation Quality Control based on Minimum Quality Loss

2006 IEEE International Conference on Automation Science and Engineering

Author(s): Chun Chen ; Liping Zhao ; YiYong Yao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Shanghai, China
Conference Date: 8 October 2006
Page(s): 437 - 441
ISBN (CD): 1-4244-0311-1
ISBN (Paper): 1-4244-0310-3
DOI: 10.1109/COASE.2006.326921
Regular:

Aiming at the problem of mutual influence between multi-operation and the optimization of quality control in product manufacturing process, quality transfer model between the preceding operation... View More

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