IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Computational Method of Fault Probability for New Product Development Based on Intelligence and Integration

2006 IEEE International Conference on Automation Science and Engineering

Author(s): Fei Li ; LiPing Zhao ; YiYong Yao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Shanghai, China
Conference Date: 8 October 2006
Page(s): 319 - 324
ISBN (CD): 1-4244-0311-1
ISBN (Paper): 1-4244-0310-3
DOI: 10.1109/COASE.2006.326901
Regular:

Computing fault probability is an effective method of predicting the possible weakness of new product. Aiming at computing fault probability of each component of new product, and ensuring... View More

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