IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Computational Method of Fault Probability for New Product Development Based on Intelligence and Integration
2006 IEEE International Conference on Automation Science and Engineering
Author(s): | Fei Li ; LiPing Zhao ; YiYong Yao |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 October 2006 |
Conference Location: | Shanghai, China |
Conference Date: | 8 October 2006 |
Page(s): | 319 - 324 |
ISBN (CD): | 1-4244-0311-1 |
ISBN (Paper): | 1-4244-0310-3 |
DOI: | 10.1109/COASE.2006.326901 |
Regular:
Computing fault probability is an effective method of predicting the possible weakness of new product. Aiming at computing fault probability of each component of new product, and ensuring... View More