IEEE - Institute of Electrical and Electronics Engineers, Inc. - Work In Progress: Reliability Test Facility

Frontiers in Education 36th Annual Conference

Author(s): C.L. Swain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: San Diego, CA, USA
Conference Date: 27 October 2006
Page(s): 12 - 13
ISBN (CD): 1-4244-0257-3
ISBN (Paper): 1-4244-0256-5
ISSN (Paper): 0190-5848
DOI: 10.1109/FIE.2006.322668
Regular:

At the Rochester Institute of Technology students take courses in automated data acquisition, electronics packaging, and failure analysis and reliability. There are also facilities to do... View More

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