IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microstructured surface layer induced by shot peening and its effect on fatigue strength

2006 IEEE International Symposium on Micro-NanoMechatronics and Human Science

Author(s): H. Mano ; S. Kondo ; A. Matsumuro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Nagoya, Japan
Conference Date: 5 November 2006
Page(s): 1 - 4
ISBN (CD): 1-4244-0718-1
ISBN (Paper): 1-4244-0717-6
DOI: 10.1109/MHS.2006.320259
Regular:

The shot peening process under normal conditions produces a compressive residual stress on the surface of a material without inducing a phase transformation. However, the shot peening process... View More

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