IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabrication of Gratings for an X-ray Talbot Interferometer

2006 IEEE International Symposium on Micro-NanoMechatronics and Human Science

Author(s): M. Tanaka ; Y. Takeda ; D. Noda ; W. Yashiro ; K. Okuda ; A. Momose ; T. Hattori
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Nagoya, Japan
Conference Date: 5 November 2006
Page(s): 1 - 6
ISBN (CD): 1-4244-0718-1
ISBN (Paper): 1-4244-0717-6
DOI: 10.1109/MHS.2006.320247
Regular:

X-ray based imaging measurement has found applications in fields such as medical diagnosis and nondestructive inspection, having become one of essential technologies. However, its low sensitivity... View More

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