IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Linear-Time Approach for Static Timing Analysis Covering All Process Corners

IEEE/ACM International Conference on Computer Aided Design - Digest of Technical Papers

Author(s): S. Onaissi ; F.N. Najm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: San Jose, CA, USA
Conference Date: 5 November 2006
Page(s): 217 - 224
ISBN (CD): 1-59593-389-1
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2006.320139
Regular:

Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process corners (combinations of... View More

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