IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced Error Vector Magnitude (EVM) Measurements for Testing WLAN Transceivers

IEEE/ACM International Conference on Computer Aided Design - Digest of Technical Papers

Author(s): E. Acar ; S. Ozev ; K.B. Redmond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: San Jose, CA, USA
Conference Date: 5 November 2006
Page(s): 210 - 216
ISBN (CD): 1-59593-389-1
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2006.320138
Regular:

As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable... View More

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