IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Framework for Faster-than-at-Speed Delay Test Considering IR-drop Effects

IEEE/ACM International Conference on Computer Aided Design - Digest of Technical Papers

Author(s): N. Ahmed ; M. Tehranipoor ; V. Jayaram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: San Jose, CA, USA
Conference Date: 5 November 2006
Page(s): 198 - 203
ISBN (CD): 1-59593-389-1
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2006.320136
Regular:

Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exacerbate the... View More

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