IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and Modeling of CD Variation for Statistical Static Timing

IEEE/ACM International Conference on Computer Aided Design - Digest of Technical Papers

Author(s): B. Cline ; K. Chopra ; D. Blaauw ; Yu Cao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: San Jose, CA, USA
Conference Date: 5 November 2006
Page(s): 60 - 66
ISBN (CD): 1-59593-389-1
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2006.320134
Regular:

Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused on the modeling... View More

Advertisement