IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Estimation of Parametric Yield under Limited Descriptions of Uncertainty

IEEE/ACM International Conference on Computer Aided Design - Digest of Technical Papers

Author(s): Wei-Shen Wang ; M. Orshansky
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: San Jose, CA, USA
Conference Date: 5 November 2006
Page(s): 884 - 890
ISBN (CD): 1-59593-389-1
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2006.320093
Regular:

Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributional properties of... View More

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