IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Tool for Automatic Detection of Deadlock in Wormhole Networks on Chip

11th IEEE International High Level Design Validation and Test Workshop

Author(s): S. Taktak ; E. Encrenaz ; J.-L. Desbarbieux
Sponsor(s): IEEE Comput. Soc. Test Technol. Tech. Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Monterey, CA, USA
Conference Date: 8 November 2006
Page(s): 203 - 210
ISBN (CD): 1-4244-0680-3
ISBN (Paper): 1-4244-0679-X
ISSN (Paper): 1552-6674
DOI: 10.1109/HLDVT.2006.319992
Regular:

We present an extension of Duato's necessary and sufficient condition a routing function must satisfy in order to be deadlock-free, to support environment constraints inducing extra-dependencies... View More

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