IEEE - Institute of Electrical and Electronics Engineers, Inc. - Trends in Test: Challenges and Techniques

11th IEEE International High Level Design Validation and Test Workshop

Author(s): W. Meyer
Sponsor(s): IEEE Comput. Soc. Test Technol. Tech. Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Monterey, CA, USA
Conference Date: 8 November 2006
Page(s): 37
ISBN (CD): 1-4244-0680-3
ISBN (Paper): 1-4244-0679-X
ISSN (Paper): 1552-6674
DOI: 10.1109/HLDVT.2006.319998
Regular:

Summary form only given. Ever increasing design sizes and the need for more sophisticated fault models at smaller process geometries require the use of compression technology to reduce the size of... View More

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