IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Coverage Directed Test Generation Using a Cell-Based Genetic Algorithm

11th IEEE International High Level Design Validation and Test Workshop

Author(s): A. Samarah ; A. Habibi ; S. Tahar ; N. Kharma
Sponsor(s): IEEE Comput. Soc. Test Technol. Tech. Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Monterey, CA, USA
Conference Date: 8 November 2006
Page(s): 19 - 26
ISBN (CD): 1-4244-0680-3
ISBN (Paper): 1-4244-0679-X
ISSN (Paper): 1552-6674
DOI: 10.1109/HLDVT.2006.319996
Regular:

Functional verification is a major challenge in the hardware design development cycle. Defining the appropriate coverage points that capture the design's functionalities is a non-trivial problem.... View More

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