IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Directive Generation for Functional Coverage Closure Using Inductive Logic Programming

11th IEEE International High Level Design Validation and Test Workshop

Author(s): Hsiou-Wen Hsueh ; K. Eder
Sponsor(s): IEEE Comput. Soc. Test Technol. Tech. Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Conference Location: Monterey, CA, USA
Conference Date: 8 November 2006
Page(s): 11 - 18
ISBN (CD): 1-4244-0680-3
ISBN (Paper): 1-4244-0679-X
ISSN (Paper): 1552-6674
DOI: 10.1109/HLDVT.2006.320005
Regular:

Functional verification is a complex and time-consuming task in the design process. Recently, various approaches have been developed to improve verification efficiency, including advanced coverage... View More

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