IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temperature measurement system based on the phase shift of fluorescence response

2006 SICE-ICASE International Joint Conference

Author(s): H. Aizawa ; T. Katsumata ; S. Komuro ; T. Morikawa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Busan, South Korea
Conference Date: 18 October 2006
Page(s): 1,621 - 1,624
ISBN (CD): 89-950038-5-5
ISBN (Paper): 89-950038-4-7
DOI: 10.1109/SICE.2006.315520
Regular:

A temperature measurement system based on the temperature dependence of the phase shift of fluorescence response was developed. The temperature measurement system consist of the light source,... View More

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