IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fluorescence Thermometer Application of Cr Doped Spinel Crystals

2006 SICE-ICASE International Joint Conference

Author(s): J. Someya ; C. Nojiri ; H. Aizawa ; T. Katsumata ; S. Komuro ; T. Morikawa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Busan, South Korea
Conference Date: 18 October 2006
Page(s): 1,582 - 1,585
ISBN (CD): 89-950038-5-5
ISBN (Paper): 89-950038-4-7
DOI: 10.1109/SICE.2006.315510
Regular:

Temperature dependences of peak intensity and peak intensity ratio of photoluminescence from Cr doped spinel sensor are evaluated for fluorescence thermometer applications. Peak intensity and... View More

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