IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian Sampling of Virtual Examples to Improve Classification Accuracy

2006 SICE-ICASE International Joint Conference

Author(s): Yujung Lee ; Jaeho Kang ; Byoungho Kang ; Kwang Ryel Ryu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Busan, South Korea
Conference Date: 18 October 2006
Page(s): 1,009 - 1,014
ISBN (CD): 89-950038-5-5
ISBN (Paper): 89-950038-4-7
DOI: 10.1109/SICE.2006.315740
Regular:

A virtual example is an artificial example that does not exist in the given training set. We sample a virtual example from a Bayesian network constructed with the original training set. The... View More

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