IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image-based Structural Analysis of Building using Line Segments and their Geometrical Vanishing Points

2006 SICE-ICASE International Joint Conference

Author(s): Hoang-Hon Trinh ; Kang-Hyun Jo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Busan, South Korea
Conference Date: 18 October 2006
Page(s): 566 - 571
ISBN (CD): 89-950038-5-5
ISBN (Paper): 89-950038-4-7
DOI: 10.1109/SICE.2006.315548
Regular:

This paper describes an approach to detect and analyze the properties of building in image. We use line segments and belongings in the appearance of building as geometrical and physical properties... View More

Advertisement