IEEE - Institute of Electrical and Electronics Engineers, Inc. - Object Recognition using Simultaneous Pattern-Matching in Virtual Environment

2006 SICE-ICASE International Joint Conference

Author(s): Y. Takahashi ; Y. Muramatu ; K. Kato
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Busan, South Korea
Conference Date: 18 October 2006
Page(s): 5,579 - 5,583
ISBN (CD): 89-950038-5-5
ISBN (Paper): 89-950038-4-7
DOI: 10.1109/SICE.2006.315780
Regular:

This paper proposes a method of object recognition using simultaneous pattern-matching, in which the system generates an object image from a 3D model simultaneously in the recognition phase and... View More

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