IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Tool for Advanced Learning of LFSR-Based Testing Principles

International Biennial Baltic Electronics Conference

Author(s): A. Jutman ; A. Tsertov ; R. Ubar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Tallinn, Estonia
Conference Date: 2 October 2006
Page(s): 1 - 4
ISBN (CD): 1-4244-0415-0
ISBN (Paper): 1-4244-0414-2
ISSN (Paper): 1736-3705
DOI: 10.1109/BEC.2006.311091
Regular:

Linear feedback shift registers (LFSR) has become one of the central elements used in testing and self testing of contemporary complex electronic systems like processors, controllers, and... View More

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