IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Biometric Techniques, Standards Activities and Experimenting

International Biennial Baltic Electronics Conference

Author(s): R. Volner ; P. Bores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Tallinn, Estonia
Conference Date: 2 October 2006
Page(s): 1 - 4
ISBN (CD): 1-4244-0415-0
ISBN (Paper): 1-4244-0414-2
ISSN (Paper): 1736-3705
DOI: 10.1109/BEC.2006.311080
Regular:

The concepts of applying multiple biometric techniques or devices to solve the practical problems that plague biometric deployments have been under development and analysis for some time. The... View More

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