IEEE - Institute of Electrical and Electronics Engineers, Inc. - Behavioral Model based Simulation Methods for Charge-Pump PLL's

International Biennial Baltic Electronics Conference

Author(s): T. Rapinoja ; K. Stadius ; K. Halonen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Tallinn, Estonia
Conference Date: 2 October 2006
Page(s): 1 - 4
ISBN (CD): 1-4244-0415-0
ISBN (Paper): 1-4244-0414-2
ISSN (Paper): 1736-3705
DOI: 10.1109/BEC.2006.311073
Regular:

This paper discusses the ubiquitous problem of extremely long simulation times in transistor-level design of phase-locked loops (PLL). Methods for reducing time-domain simulation times arc... View More

Advertisement