IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate Capture Models and Their Impact on Random Access in Multiple-Destination Networks

MILCOM 2006

Author(s): G.D. Nguyen ; J.E. Wieselthier ; A. Ephremides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Washington, DC, USA
Conference Date: 23 October 2006
Page(s): 1 - 7
ISBN (CD): 1-4244-0618-8
ISBN (Paper): 1-4244-0617-X
DOI: 10.1109/MILCOM.2006.302125
Regular:

We extend existing models to better characterize the impact of the physical layer on random-access performance, and we highlight some ambiguities and inaccuracies that have been prevalent in the... View More

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