IEEE - Institute of Electrical and Electronics Engineers, Inc. - Shot Noise Models for Outage and Throughput Analyses in Wireless Ad Hoc Networks

MILCOM 2006

Author(s): Jagadish Venkataraman ; M. Haenggi ; O. Collins
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Washington, DC, USA
Conference Date: 23 October 2006
Page(s): 1 - 7
ISBN (CD): 1-4244-0618-8
ISBN (Paper): 1-4244-0617-X
DOI: 10.1109/MILCOM.2006.302418
Regular:

Shot noise processes with a decaying power law impulse response function are ideally suited for modeling the network self-interference in an ad hoc network where the nodes are distributed in a... View More

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