IEEE - Institute of Electrical and Electronics Engineers, Inc. - Property Driven Test Generation in Absence of Direct Interface

2006 Annual IEEE India Conference

Author(s): Bhaskar Pal ; Pallab Dasgupta ; P.P. Chakrabarti
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2006
Conference Location: New Delhi, India
Conference Date: 15 September 2006
Page(s): 1 - 6
ISBN (CD): 1-4244-0370-7
ISBN (Paper): 1-4244-0369-3
ISSN (Electronic): 2325-9418
ISSN (Paper): 2325-940X
DOI: 10.1109/INDCON.2006.302829
Regular:

This paper presents an automatic test generation methodology for complex coverage points in the context of systems consisting of an environment (E), a machine (M) and a controller (C). The... View More

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