IEEE - Institute of Electrical and Electronics Engineers, Inc. - A MTF-Based Distance for the Assessment of Geometrical Quality of Fused Products

2006 9th International Conference on Information Fusion

Author(s): C. Thomas ; L. Wald
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2006
Conference Location: Florence, Italy
Conference Date: 10 July 2006
Page(s): 1 - 7
ISBN (CD): 0-9721844-6-5
ISBN (Paper): 1-4244-0953-5
DOI: 10.1109/ICIF.2006.301687
Regular:

This paper deals with the assessment of the quality of the products resulting from the application of fusion methods, exploiting the synergy of multimodal images at a low spatial resolution and... View More

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