IEEE - Institute of Electrical and Electronics Engineers, Inc. - High-Speed I/O Tests in High-Volume Manufacturing

2006 IEEE International Test Conference

Author(s): Brian Swing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 2
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297764
Regular:

As high speed IO buses increase in number on emerging devices, new test challenges will drive changes in tester configuration and performance. HVM Tester pin capabilities will shift away from pure... View More

Advertisement