IEEE - Institute of Electrical and Electronics Engineers, Inc. - Zero defect mission requires an arsenal

2006 IEEE International Test Conference

Author(s): D. Migl
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 2
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297755
Regular:

Saying "no" to managers and automotive customers asking for zero defects is virtually the same as saying no to the ~$ 16b opportunity that the automotive semiconductor industry represents. The... View More

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