IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Design and Validation of IP for DFM/DFY Assurance

2006 IEEE International Test Conference

Author(s): R. Aitken
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 7
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297742
Regular:

Design for manufacturability (DFM) is becoming increasingly important as process geometries shrink. The system-on-chip business model requires high quality, high yielding IP. This paper shows how... View More

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