IEEE - Institute of Electrical and Electronics Engineers, Inc. - Structural Testing of High-Speed Serial Buses: A Case Study Analysis

2006 IEEE International Test Conference

Author(s): E. Johnson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 9
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297737
Regular:

As the speed of serial buses breaks into multi-gigabits per second (Gb/S), current structural testing methodologies break down. Direct physical access to buses is becoming impossible due to board... View More

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