IEEE - Institute of Electrical and Electronics Engineers, Inc. - Structural Tests for Jitter Tolerance in SerDes Receivers

2006 IEEE International Test Conference

Author(s): S. Sunter ; A. Roy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 10
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297726
Regular:

A suite of structural tests is described that uses on-chip under sampling to measure parameters that affect jitter tolerance in a multi-gigabit-per-second (Gbps) receiver. The tests measure... View More

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